Scanning Probe Microscope Bruker Dimension Icon

Veronika Králová

The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.

Scanning Probe Microscope Bruker Dimension Icon

Techniques

Non-contact Mode
Contact Mode
Tapping Mode (intermittent, tapping)
Phase Imaging
Lateral Force Microscopy (LFM)
Force Spectroscopy
Force Modulation
Force Volume
Electric Field Microscopy (EFM)
Surface Potential Microscopy / Kelvin Probe Force Microscopy
Magnetic Force Microscopy (MFM)
STM
PeakForce TUNA/CAFM , PeakForce QNM
Nanoindentation
Electrochemistry + potentiostat

System is capable of measurements in ScanAsyst mode.

Scanner

Lateral range	90 μm
Vertical range	10 μm
Close-loop	(all three axis)
Automatic approach to sample
Lateral noise	less than 0.15 nm RMS (close-loop on)
Vertical noise	less than 35 pm RMS (close-loop on)

Sample Holder

Maximum sample size	210 mm in diameter
Maximum sample height	15 mm
Vacuum hold
Scripting (automatic possitioning)
Repetability	2 μm
Temperature range	–35°C to 250°C